AMO GmbH
  • About AMO
    • Team
    • Mission and values
    • Our story
    • Alumni
  • What we do
    • Research
    • Cleanroom Technology
    • Technology Transfer
    • Education & Training
    • Spin-offs & Start-ups
  • Research
    • Graphene Electronics
      • Highlights Graphene Electronics
    • Nanophotonics
      • Highlights Nanophotonics
    • Nanostructuring
    • Perovskite Optoelectronics
    • Sensor Technology and Energy Converters
    • Metrology
    • Projects
    • Publications
    • Good Scientific Practice
  • News & Events
    • News
    • nanovate!
    • Events
  • Careers
  • Contact
  • Downloads
  • Click to open the search input field Click to open the search input field Search
  • Menu Menu
  • Link to LinkedIn
Blog - Latest News
You are here: Home1 / AMO News EN2 / Complex optical constants of CsPbCI3 perovskite thin films determined by...

Complex optical constants of CsPbCI3 perovskite thin films determined by spectroscopic ellipsometry

17. July 2025

🎉Congratulations to Sana Khan and the Perovskite Optoelectronics Group at AMO GmbH on their recent publication in APL Energy! 🎉

In this study, the team reports the optical constants of CsPbCl₃ perovskite thin films, determined via spectroscopic ellipsometry.
Using a model based on Tauc–Lorentz and harmonic oscillators, they identified:

➡️A sharp absorption edge at 411 nm
➡️An optical bandgap of ~2.99 eV.

These findings provide valuable insights for the development of wide-bandgap perovskite optoelectronics.

Sana Khan, Piotr Jacek Cegielski, Manuel Runkel, Thomas Riedl, Maryam Mohammadi, Max Lemme, “Complex optical constants of CsPbCl3 perovskite thin films determined by spectroscopic ellipsometry Open Access”, APL Energy 3, 026108 (2025).

Share this entry
  • Share on Facebook
  • Share on LinkedIn
https://www.amo.de/wp-content/uploads/2025/10/1752657260187.jpg 415 800 Sara Sarhani https://www.amo.de/wp-content/uploads/2021/03/AMO_Logo.jpg Sara Sarhani2025-07-17 12:46:092025-10-02 12:55:09Complex optical constants of CsPbCI3 perovskite thin films determined by spectroscopic ellipsometry

Search

Search Search

Archive

About AMO

  • News & Events
  • Careers
  • Contact
  • Downloads

What we do

  • Research
  • Cleanroom Technology
  • Technology Transfer
  • Education & Training
  • Spin-offs & Start-ups

Research

  • Graphene Electronics
  • Nanophotonics
  • Nanostructuring
  • Perovskite Optoelectronics
  • Sensor Technology and Energy Converters
  • Publications

© 2023 AMO GmbH |
  • GTC
  • Impressum
  • Privacy Policy
Link to: Visit from Daniel Schall – Reflecting on Research and Exploring Future Collaboration Link to: Visit from Daniel Schall – Reflecting on Research and Exploring Future Collaboration Visit from Daniel Schall – Reflecting on Research and Exploring Future Co... Link to: Scalable Dielectric Integration on Graphene for Next-Generation Electronic Devices Link to: Scalable Dielectric Integration on Graphene for Next-Generation Electronic Devices Scalable Dielectric Integration on Graphene for Next-Generation Electronic ...
Scroll to top Scroll to top Scroll to top