Research
Metrology
Metrology lies at the heart of materials science and the semiconductor industry, encompassing advanced materials and device characterization techniques. As an essential link across multiple research disciplines, it provides the critical insights needed to understand materials, interfaces, and processes at the nanoscale.
The Metrology Group at AMO advances materials research through the development and application of state-of-the-art characterization and measurement methods, supporting all stages of material synthesis and device fabrication. With a vision to establish advanced and robust research infrastructure in North Rhine-Westphalia for sustainable future technologies, the group provides cutting-edge facilities, resources, and expertise that empower researchers and industry partners to deliver breakthrough discoveries and address complex technological challenges.
Group Leader: Dr. Satender Kataria
