It is possible to limit statistical error in metrology and sensing by using quantum systems. These quantum systems can reach the Heisenberg limit, which is proportional to 1/N for measurements. However, applying quantum standards and sensors is challenging due to their intrinsic incompatibility of their working conditions.

The EU-funded FLATS project proposes to use twisted bilayer graphene as a multi-phenomenon platform to develop electrical quantum metrology standards that can work under compatible conditions. It will also create a new generation of metrological sensors that go beyond the International System of units. The common platform will enable the establishment of a single multi-use on-chip quantum lab. The results will be the first step toward quantum-enhanced measurements for metrological applications.

FLATS is funded by the Εuropean Union under the Horizon Europe grant 101099139.